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Cover image for Advances in Artificial Intelligence in Manufacturing II Proceedings of the 2nd European Symposium on Artificial Intelligence in Manufacturing, October 16, 2024, Athens, Greece
Advances in Artificial Intelligence in Manufacturing II Proceedings of the 2nd European Symposium on Artificial Intelligence in Manufacturing, October 16, 2024, Athens, Greece
Author 
Alexopoulos, Kosmas. editor. (orcid)0000-0002-3658-6838 Makris, Sotiris. editor. (orcid)0000-0001-9687-5925 Stavropoulos, Panagiotis. editor. (orcid)0000-0003-0724-7957 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-86489-6
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Cover image for Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic TEPEN2024-IWFDP - Volume 2
Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic TEPEN2024-IWFDP - Volume 2
Author 
Wang, Zuolu. editor. Zhang, Kai. editor. Feng, Ke. editor. Xu, Yuandong. editor. Yang, Wenxian. editor. (orcid)0000-0002-1122-2990
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https://doi.org/10.1007/978-3-031-73407-6
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Cover image for Advances in artificial intelligence applications in industrial and systems engineering
Advances in artificial intelligence applications in industrial and systems engineering
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Salvendy, Gavriel, 1938- editor. Karwowski, Waldemar, 1953- editor. Duffy, Vincent G. editor http://id.loc.gov/authorities/names/nb2007019323
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TA347 .A78 A3856 2025
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https://onlinelibrary.wiley.com/doi/book/10.1002/9781394257096
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4. 
Cover image for Reliability Engineering for Industrial Processes An Analytics Perspective
Reliability Engineering for Industrial Processes An Analytics Perspective
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Kapur, P. K. editor. (orcid)0000-0001-8006-5952 Pham, Hoang. editor. Singh, Gurinder. editor. (orcid)0000-0002-7827-1578 Kumar, Vivek. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-55048-5
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Cover image for Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment
Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment
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Tamura, Yoshinobu. author. (orcid)0000-0001-7665-5765 Yamada, Shigeru. author. SpringerLink (Online service)
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Cover image for Soft Computing in Industry 5.0 for Sustainability
Soft Computing in Industry 5.0 for Sustainability
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Reddy, C Kishor Kumar. editor. Sithole, Thandiwe. editor. Ouaissa, Mariya. editor. ÖZER, Özen. editor. Hanafiah, Marlia M. editor. (orcid)0000-0002-8565-0488
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https://doi.org/10.1007/978-3-031-69336-6
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Cover image for International Conference on Systems and Technologies for Smart Agriculture ICSTA 2023
International Conference on Systems and Technologies for Smart Agriculture ICSTA 2023
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Saha, Himadri Nath. editor. Ray, Hena. editor. Bradford, Phillip G. editor. (orcid)0000-0001-5628-8953 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-5157-0
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8. 
Cover image for Advances in Artificial Intelligence in Manufacturing Proceedings of the 1st European Symposium on Artificial Intelligence in Manufacturing, September 19, 2023, Kaiserslautern, Germany
Advances in Artificial Intelligence in Manufacturing Proceedings of the 1st European Symposium on Artificial Intelligence in Manufacturing, September 19, 2023, Kaiserslautern, Germany
Author 
Wagner, Achim. editor. (orcid)0000-0002-0966-2559 Alexopoulos, Kosmas. editor. (orcid)0000-0002-3658-6838 Makris, Sotiris. editor. (orcid)0000-0001-9687-5925 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-57496-2
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9. 
Cover image for Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic TEPEN2024-IWFDP - Volume 1
Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic TEPEN2024-IWFDP - Volume 1
Author 
Chen, Bingyan. editor. (orcid)0000-0001-7103-0221 Liang, Xiaoxia. editor. Lin, Tian Ran. editor. (orcid)0000-0001-6869-4617 Chu, Fulei. editor. (orcid)0000-0003-0775-3593 Ball, Andrew D. editor. (orcid)0000-0001-7540-8965
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10. 
Cover image for Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic TEPEN2024-IWFDP - Volume 3
Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic TEPEN2024-IWFDP - Volume 3
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Liu, Tongtong. editor. Zhang, Fan. editor. Huang, Shiqing. editor. Wang, Jingjing. editor. Gu, Fengshou. editor. (orcid)0000-0003-4907-525X
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https://doi.org/10.1007/978-3-031-69483-7
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11. 
Cover image for Innovative Systems Approach for Facilitating Smarter World
Innovative Systems Approach for Facilitating Smarter World
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Kaihara, Toshiya. editor. Kita, Hajime. editor. Takahashi, Shingo. editor. Funabashi, Motohisa. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-19-7776-3
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12. 
Cover image for Trends in Educational Activity in the Field of Mechanism and Machine Theory (2018-2022) Selected Papers from ISEMMS 2022
Trends in Educational Activity in the Field of Mechanism and Machine Theory (2018-2022) Selected Papers from ISEMMS 2022
Author 
García Prada, Juan Carlos. editor. Castejon, Cristina. editor. Pedrero Moya, Jose Ignacio. editor. SpringerLink (Online service)
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