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1. 
Cover image for Nondestructive Testing of Materials and Structures
Nondestructive Testing of Materials and Structures
Author 
Büyüköztürk, Oral. author. Taşdemir, Mehmet Ali. author. Güneş, Oğuz. editor. Akkaya, Yılmaz. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335698.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-0723-8
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2. 
Cover image for Non-destructive Testing and Repair of Pipelines
Non-destructive Testing and Repair of Pipelines
Author 
Barkanov, Evgeny N. editor. Dumitrescu, Andrei. editor. Parinov, Ivan A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-56579-8
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3. 
Cover image for Direct Conversion Semiconductor Radiation Detectors using Si, CdTe and CdZnTe
Direct Conversion Semiconductor Radiation Detectors using Si, CdTe and CdZnTe
Author 
Iniewski, Krzysztof Kris. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-94005-7
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4. 
Cover image for Mechanical Testing of Materials
Mechanical Testing of Materials
Author 
Gdoutos, Emmanuel. author. Konsta-Gdoutos, Maria. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-45990-0
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5. 
Cover image for X-ray Photon Processing Detectors Space, Industrial, and Medical applications
X-ray Photon Processing Detectors Space, Industrial, and Medical applications
Author 
Hansson, Conny. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-35241-6
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