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1. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley Online Library
Format: 
Availability 
Online Library~1
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2. 
Cover image for Handbook of Metrology and Applications
Handbook of Metrology and Applications
Author 
Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-2074-7
Format: 
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3. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080964546
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4. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
Preferred Shelf Number 
ONLINE(355774.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546
Format: 
Availability 
Online Library~1
Available:
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