Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Title:
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author:
Foster, Adam. author.
ISBN:
9780387372310
Physical Description:
XIV, 281 p. 116 illus. online resource.
Series:
NanoScience and Technology,
Series Title:
NanoScience and Technology, 1434-4904
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E-Book 166196-2001 ONLINE
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