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1. 
Cover image for Mid-infrared Semiconductor Optoelectronics
Mid-infrared Semiconductor Optoelectronics
Author 
Krier, Anthony. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-209-8
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2. 
Cover image for Nanoscale Photonics and Optoelectronics Science and Technology
Nanoscale Photonics and Optoelectronics Science and Technology
Author 
Wang, Zhiming M. editor. Neogi, Arup. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7587-4
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3. 
Cover image for Ultrathin Metal Transparent Electrodes for the Optoelectronics Industry
Ultrathin Metal Transparent Electrodes for the Optoelectronics Industry
Author 
Ghosh, Dhriti Sundar. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332727.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00348-1
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4. 
Cover image for Bismuth-Containing Compounds
Bismuth-Containing Compounds
Author 
Li, Handong. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332391.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8121-8
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5. 
Cover image for Silicon-based Nanomaterials
Silicon-based Nanomaterials
Author 
Li, Handong. editor. Wu, Jiang. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332396.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8169-0
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6. 
Cover image for Ultra-Short Pulsed Laser Engineered Metal-Glass Nanocomposites
Ultra-Short Pulsed Laser Engineered Metal-Glass Nanocomposites
Author 
Stalmashonak, Andrei. author. Seifert, Gerhard. author. Abdolvand, Amin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332752.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00437-2
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7. 
Cover image for Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Author 
Pajot, Bernard. author. Clerjaud, Bernard. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333081.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-18018-7
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8. 
Cover image for Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author 
Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331478.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4337-7
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9. 
Cover image for Optical Waveguiding and Applied Photonics Technological Aspects, Experimental Issue Approaches and Measurements
Optical Waveguiding and Applied Photonics Technological Aspects, Experimental Issue Approaches and Measurements
Author 
Lay-Ekuakille, Aimé. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331909.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-5959-0
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10. 
Cover image for Nanoscale Sensors
Nanoscale Sensors
Author 
Li, Shibin. editor. Wu, Jiang. editor. Wang, Zhiming M. editor. Jiang, Yadong. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332946.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02772-2
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11. 
Cover image for GaP Heteroepitaxy on Si(100) Benchmarking Surface Signals when Growing GaP on Si in CVD Ambients
GaP Heteroepitaxy on Si(100) Benchmarking Surface Signals when Growing GaP on Si in CVD Ambients
Author 
Döscher, Henning. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332952.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02880-4
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12. 
Cover image for Optical Signal Processing by Silicon Photonics
Optical Signal Processing by Silicon Photonics
Author 
Ahmed, Jameel. author. Siyal, Mohammed Yakoob. author. Adeel, Freeha. author. Hussain, Ashiq. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336520.1)
Electronic Access 
http://dx.doi.org/10.1007/978-981-4560-11-5
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