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1. 
Cover image for Science of Microscopy
Science of Microscopy
Author 
Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-49762-4
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2. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8615-1
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3. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-73886-2
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4. 
Cover image for Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-85037-3
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5. 
Cover image for Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-74080-3
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6. 
Cover image for Optical Imaging and Microscopy Techniques and Advanced Systems
Optical Imaging and Microscopy Techniques and Advanced Systems
Author 
Török, Peter. author. Kao, Fu-Jen. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-69565-3
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7. 
Cover image for Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-37316-2
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8. 
Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-28668-6
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9. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37231-8
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10. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139097
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11. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-31915-8
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