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1. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335669.1)
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9644-9
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2. 
Cover image for Computer Engineering and Technology 16th National Conference, NCCET 2012, Shanghai, China, August 17-19, 2012, Revised Selected Papers
Computer Engineering and Technology 16th National Conference, NCCET 2012, Shanghai, China, August 17-19, 2012, Revised Selected Papers
Author 
Xu, Weixia. editor. Xiao, Liquan. editor. Lu, Pingjing. editor. Li, Jinwen. editor. Zhang, Chengyi. editor.
Preferred Shelf Number 
ONLINE(334080.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35898-2
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3. 
Cover image for Computer Engineering and Technology 17th CCF Conference, NCCET 2013, Xining, China, July 20-22, 2013. Revised Selected Papers
Computer Engineering and Technology 17th CCF Conference, NCCET 2013, Xining, China, July 20-22, 2013. Revised Selected Papers
Author 
Xu, Weixia. editor. Xiao, Liquan. editor. Zhang, Chengyi. editor. Li, Jinwen. editor. Yu, Liyan. editor.
Preferred Shelf Number 
ONLINE(335131.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-41635-4
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