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Cover image for Statistical methods for reliability data
Statistical methods for reliability data
Author 
Meeker, William Q. Escobar, Luis A., ort. yaz.
Preferred Shelf Number 
TS 173 M44 1998
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Beytepe Library~1
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2. 
Cover image for Accelerated testing statistical models, test plans and data analyses
Accelerated testing statistical models, test plans and data analyses
Author 
Nelson, Wayne, 1936-
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html
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Online Library~1
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