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1. 
Cover image for Vertical 3D memory technologies
Vertical 3D memory technologies
Author 
Prince, Betty, author.
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ONLINE(341730.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118760475
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118760468
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2. 
Cover image for Dynamic RAM technology advancements
Dynamic RAM technology advancements
Author 
Siddiqi, Muzaffer A.
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3. 
Cover image for Nonvolatile memory design magnetic, resistive, and phase change
Nonvolatile memory design magnetic, resistive, and phase change
Author 
Li, Hai, 1975- Chen, Yiran, 1976-
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ONLINE
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4. 
Cover image for Floating body cell a novel capacitor-less DRAM cell
Floating body cell a novel capacitor-less DRAM cell
Author 
Ohsawa, Takashi. Hamamoto, Takeshi.
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5. 
Cover image for Silicon non-volatile memories paths of innovation
Silicon non-volatile memories paths of innovation
Author 
De Salvo, Barbara. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Ebook Library Click here to view book
John Wiley http://dx.doi.org/10.1002/9780470611814
http://site.ebrary.com/lib/alltitles/Doc?id=10360919
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6. 
Cover image for Memory, microprocessor, and ASIC
Memory, microprocessor, and ASIC
Author 
Chen, Wai-Kai, 1936-
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7. 
Cover image for Advanced semiconductor memories architectures, designs, and applications
Advanced semiconductor memories architectures, designs, and applications
Author 
Sharma, Ashok K.
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Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562
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8. 
Cover image for Nonvolatile semiconductor memory technology a comprehensive guide to understanding and to using NVSM devices
Nonvolatile semiconductor memory technology a comprehensive guide to understanding and to using NVSM devices
Author 
Brown, William D., 1943- Brewer, Joe (Joe E.)
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122
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9. 
Cover image for Semiconductor memories technology, testing, and reliability
Semiconductor memories technology, testing, and reliability
Author 
Sharma, Ashok K. IEEE Solid-State Circuits Council.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
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