Accelerating Test, Validation and Debug of High Speed Serial Interfaces

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Title:

Author:

Fan, Yongquan. author.

ISBN:

9789048193981

Physical Description:

XII, 250p. 120 illus., 60 illus. in color. online resource.

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	205484-2001	ONLINE	Searching... Unknown	Searching... Unavailable