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1. 
Cover image for Solid-state physics for electronics
Solid-state physics for electronics
Author 
Moliton, André. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477689
John Wiley http://dx.doi.org/10.1002/9780470611487
http://swb.eblib.com/patron/FullRecord.aspx?p=477689
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2. 
Cover image for Innovations and Dynamics in Photonics and Electronics
Innovations and Dynamics in Photonics and Electronics
Author 
Katti, Vijaya. editor. Pande, Milind. editor. Jadhav, Pravin. editor. Katti, Aavishkar. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-96-3065-3
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3. 
Cover image for Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Author 
Ciofi, Carmine. editor. Limiti, Ernesto. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-48711-8
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4. 
Cover image for Biomedical Electronics, Noise Shaping ADCs, and Frequency References Advances in Analog Circuit Design 2022
Biomedical Electronics, Noise Shaping ADCs, and Frequency References Advances in Analog Circuit Design 2022
Author 
Harpe, Pieter. editor. Baschirotto, Andrea. editor. Makinwa, Kofi A.A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-28912-5
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5. 
Cover image for Proceedings of SIE 2022 53rd Annual Meeting of the Italian Electronics Society
Proceedings of SIE 2022 53rd Annual Meeting of the Italian Electronics Society
Author 
Cocorullo, Giuseppe. editor. Crupi, Felice. editor. Limiti, Ernesto. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-26066-7
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6. 
Cover image for Modeling of AlGaN/GaN High Electron Mobility Transistors
Modeling of AlGaN/GaN High Electron Mobility Transistors
Author 
Nirmal, D. editor. Ajayan, J. editor. (orcid)0000-0002-2398-3690 SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-7506-4
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7. 
Cover image for Single-Photon Avalanche Diodes and Photon Counting Systems From Phototransduction to Circuit Architecture
Single-Photon Avalanche Diodes and Photon Counting Systems From Phototransduction to Circuit Architecture
Author 
Dandin, Marc. author. McFarlane, Nicole. author. Sajal, Md Sakibur. author. Dehghandehnavi, Fahimeh. author. Nouri, Babak. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-64334-7
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8. 
Cover image for CMOS Plasma and Process Damage
CMOS Plasma and Process Damage
Author 
Prall, Kirk. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-89029-1
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9. 
Cover image for Silicon Components and Processes Self Study Field-Effect Transistors
Silicon Components and Processes Self Study Field-Effect Transistors
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-59193-8
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10. 
Cover image for Flip Chip, Hybrid Bonding, Fan-In, and Fan-Out Technology
Flip Chip, Hybrid Bonding, Fan-In, and Fan-Out Technology
Author 
Lau, John H. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-97-2140-5
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11. 
Cover image for Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
Author 
van Driel, Willem Dirk. editor. Pressel, Klaus. editor. Soyturk, Mujdat. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-59361-1
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12. 
Cover image for X-ray Photon Processing Detectors Space, Industrial, and Medical applications
X-ray Photon Processing Detectors Space, Industrial, and Medical applications
Author 
Hansson, Conny. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-35241-6
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