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1. 
Cover image for Surfaces and interfaces of electronic materials
Surfaces and interfaces of electronic materials
Author 
Brillson, L. J.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=951893
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6542360
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6542360
John Wiley http://dx.doi.org/10.1002/9783527665709
MyiLibrary, Table of contents http://www.myilibrary.com?id=371977&ref=toc
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2. 
Cover image for Optical techniques for solid-state materials characterization
Optical techniques for solid-state materials characterization
Author 
Prasankumar, Rohit P. Taylor, Antoinette J., 1956-
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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3. 
Cover image for Kramers-Kronig Relations in Optical Materials Research
Kramers-Kronig Relations in Optical Materials Research
Author 
Lucarini, Valerio. author. Peiponen, Kai-Erik. author. Saarinen, Jarkko J. author. Vartiainen, Erik M. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138913
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4. 
Cover image for Modern Luminescence Spectroscopy of Minerals and Materials
Modern Luminescence Spectroscopy of Minerals and Materials
Author 
Gaft, Michael. author. Reisfeld, Renata. author. Panczer, Gérard. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137490
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5. 
Cover image for Nanoscale spectroscopy with applications
Nanoscale spectroscopy with applications
Author 
Musa, Sarhan M., editor.
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ONLINE(342754.1)
Electronic Access 
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6. 
Cover image for Applications of vibrational spectroscopy in food science
Applications of vibrational spectroscopy in food science
Author 
Li-Chan, Eunice. Griffiths, Peter R., 1942- Chalmers, John M.
Preferred Shelf Number 
TX541 A78 2010 V.1
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Beytepe Library~2
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7. 
Cover image for Spectroscopic ellipsometry principles and applications
Spectroscopic ellipsometry principles and applications
Author 
Fujiwara, Hiroyuki. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470060193
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8. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-38347-5
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9. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138175
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10. 
Cover image for CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
Author 
Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b139047
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11. 
Cover image for The Physics of Thin Film Optical Spectra An Introduction
The Physics of Thin Film Optical Spectra An Introduction
Author 
Stenzel, Olaf. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-27905-9
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