ch. 1. Introduction / John C. Rivir̈e -- ch. 2. Problem solving : strategy, tactics, and resources / Sverre Myhra and John C. Rivir̈e -- ch. 3. Photoelectron spectroscopy (XPS and UPS), Auger electron spectroscopy (AES), and ion scattering spectroscopy (ISS) / Vaneica Y. Young and Gar B. Hoflund -- ch. 4. Ion beam techniques : time-of-flight secondary ion mass spectrometry (ToF-SIMS) / Birgit Hagenhoff, Reinhard Kerstign, and Derk Rading -- ch. 5. Surface and interface analysis by scanning probe microscopy / Sverre Myhra -- ch. 6. Transmission electron microscopy : instrumentation, imaging modes, and analytical attachments / John M. Titchmarsh -- ch. 7. Synchrotron-based techniques / Andrea R. Gerson, David J. Cookson, and Kevin C. Prince-- ch. 8. Quantification of surface and near-surface composition by AES and XPS / Sven Tougaard --

ch. 9. Structural and analytical methods for surfaces and interfaces : transmission electron microscopy / John M. Titchmarsh -- ch. 10. In-depth analysis/profiling / Franȯis Reniers and Craig R. Tewell -- ch. 11. Characterization of nanostructured materials / Matthias Werner, Alison Crossley, and Colin Johnston -- ch. 12. Problem-solving methods in tribology with surface-specific techniques / Christophe Donnet and Jean-Michel Martin -- ch. 13. Problem-solving methods in metallurgy with surface analysis / R.K. Wild -- ch. 14. Composites / Peter M.A. Sherwood -- ch. 15. Minerals, ceramics, and glasses / Roger St. C. Smart -- ch. 16. Catalyst characterization / Wolfgang E.S. Unger and Thomas Gross -- ch. 17. Surface analysis of biomaterials / Marek Jasieniak ... [et al.] -- ch. 18. Adhesion science and technology / John F. Watts -- ch. 19. Electron spectroscopy in corrosion science / James E. Castle.