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1. 
Cover image for Acoustic Scanning Probe Microscopy
Acoustic Scanning Probe Microscopy
Author 
Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333153.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-27494-7
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2. 
Cover image for Applied Scanning Probe Methods XII Characterization
Applied Scanning Probe Methods XII Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85039-7
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3. 
Cover image for Applied Scanning Probe Methods IX Characterization
Applied Scanning Probe Methods IX Characterization
Author 
Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-74083-4
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4. 
Cover image for Applied Scanning Probe Methods VI Characterization
Applied Scanning Probe Methods VI Characterization
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/11776314
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5. 
Cover image for Roadmap of Scanning Probe Microscopy
Roadmap of Scanning Probe Microscopy
Author 
Morita, Seizo. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-34315-8
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6. 
Cover image for Applied Scanning Probe Methods III Characterization
Applied Scanning Probe Methods III Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138285
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7. 
Cover image for Scanning Transmission Electron Microscopy Imaging and Analysis
Scanning Transmission Electron Microscopy Imaging and Analysis
Author 
Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7200-2
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8. 
Cover image for New Horizons of Applied Scanning Electron Microscopy
New Horizons of Applied Scanning Electron Microscopy
Author 
Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03160-1
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9. 
Cover image for Scanning Microscopy for Nanotechnology Techniques and Applications
Scanning Microscopy for Nanotechnology Techniques and Applications
Author 
Zhou, Weilie. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-39620-0
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10. 
Cover image for Applied Scanning Probe Methods IV Industrial Applications
Applied Scanning Probe Methods IV Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138289
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11. 
Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333137.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-25414-7
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12. 
Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-10497-8
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