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1. 
Cover image for 3D TCAD Simulation for Semiconductor Processes, Devices and Optoelectronics
3D TCAD Simulation for Semiconductor Processes, Devices and Optoelectronics
Author 
Li, Simon. author. Fu, Yue. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0481-1
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2. 
Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author 
Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336233.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6392-0
Format: 
Availability 
Online Library~1
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