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1. 
Cover image for Systems engineering and safety building the bridge
Systems engineering and safety building the bridge
Author 
Glismann, Peter J.
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ONLINE
Electronic Access 
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2. 
Cover image for CESAR - Cost-efficient Methods and Processes for Safety-relevant Embedded Systems
CESAR - Cost-efficient Methods and Processes for Safety-relevant Embedded Systems
Author 
Rajan, Ajitha. editor. Wahl, Thomas. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335322.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-7091-1387-5
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3. 
Cover image for The economics of human systems integration valuation of investments in people's training and education, safety and health, and work productivity
The economics of human systems integration valuation of investments in people's training and education, safety and health, and work productivity
Author 
Rouse, William B.
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ONLINE
Electronic Access 
Access restricted to McGill users
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John Wiley http://dx.doi.org/10.1002/9780470642627
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4. 
Cover image for Electronics System Design Techniques for Safety Critical Applications
Electronics System Design Techniques for Safety Critical Applications
Author 
Sterpone, Luca. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8979-4
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5. 
Cover image for Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
Author 
Lukszo, Zofia. editor. Deconinck, Geert. editor. Weijnen, Margot P. C. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3594-3
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6. 
Cover image for System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
Author 
Kochs, Hans-Dieter. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-64991-7
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7. 
Cover image for A systems approach to managing the complexities of process industries
A systems approach to managing the complexities of process industries
Author 
Salimi, Fabienne, author. Salimi, Frederic, author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9780128042137
ScienceDirect http://www.sciencedirect.com/science/book/9780128042137
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8. 
Cover image for Dependable Multicore Architectures at Nanoscale
Dependable Multicore Architectures at Nanoscale
Author 
Ottavi, Marco. editor. Gizopoulos, Dimitris. editor. Pontarelli, Salvatore. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-54422-9
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9. 
Cover image for Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Author 
Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6217-1
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10. 
Cover image for Architecting resilient systems accident avoidance and survival and recovery from disruptions
Architecting resilient systems accident avoidance and survival and recovery from disruptions
Author 
Jackson, Scott.
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532
John Wiley http://dx.doi.org/10.1002/9780470544013
http://site.ebrary.com/lib/alltitles/Doc?id=10355233
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11. 
Cover image for Design and Verification of Microprocessor Systems for High-Assurance Applications
Design and Verification of Microprocessor Systems for High-Assurance Applications
Author 
Hardin, David S. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4419-1539-9
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12. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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