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1. 
Cover image for Copper Interconnect Technology
Copper Interconnect Technology
Author 
Gupta, Tapan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0076-0
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Cover image for Nanosystems Design and Technology
Nanosystems Design and Technology
Author 
Micheli, Giovanni. author. Leblebici, Yusuf. author. Gijs, Martin. author. Vörös, Janos. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0255-9
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3. 
Cover image for LTE-Advanced Relay Technology and Standardization
LTE-Advanced Relay Technology and Standardization
Author 
Yuan, Yifei. author. SpringerLink (Online service)
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ONLINE(333255.1)
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http://dx.doi.org/10.1007/978-3-642-29676-5
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4. 
Cover image for Information Innovation Technology in Smart Cities
Information Innovation Technology in Smart Cities
Author 
Ismail, Leila. editor. Zhang, Liren. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-1741-4
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5. 
Cover image for Design Technology for Heterogeneous Embedded Systems
Design Technology for Heterogeneous Embedded Systems
Author 
Nicolescu, Gabriela. editor. O'Connor, Ian. editor. Piguet, Christian. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-94-007-1125-9
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6. 
Cover image for Ultra-thin Chip Technology and Applications
Ultra-thin Chip Technology and Applications
Author 
Burghartz, Joachim. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7276-7
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7. 
Cover image for Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-9377-9
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8. 
Cover image for PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
Author 
Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5258-8
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9. 
Cover image for Predictive Technology Model for Robust Nanoelectronic Design
Predictive Technology Model for Robust Nanoelectronic Design
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Cao, Yu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0445-3
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10. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75728-5
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11. 
Cover image for AmIware Hardware Technology Drivers of Ambient Intelligence
AmIware Hardware Technology Drivers of Ambient Intelligence
Author 
Mukherjee, Satyen. editor. Aarts, Ronald M. editor. Roovers, Raf. editor. Widdershoven, Frans. editor. Ouwerkerk, Martin. editor.
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http://dx.doi.org/10.1007/1-4020-4198-5
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12. 
Cover image for High-Speed Photodiodes in Standard CMOS Technology
High-Speed Photodiodes in Standard CMOS Technology
Author 
Radovanović, Saša. author. Annema, Anne-Johan. author. Nauta, Bram. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28592-X
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