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Cover image for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Author 
Yichuang Sun, ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS019E
Format: 
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Online Library~1
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2. 
Cover image for System-on-Chip Next generation electronics
System-on-Chip Next generation electronics
Author 
Al-Hashimi, Bashir M., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS018E
Format: 
Availability 
Online Library~1
Available:
Copies: