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1. 
Cover image for Design reliability : fundamentals and applications
Design reliability : fundamentals and applications
Author 
Dhillon, B. S. (Balbir S.), 1947-
Preferred Shelf Number 
TA174 .D4929 1999
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781420050141
Taylor & Francis https://www.taylorfrancis.com/books/9780367802400
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Statistical modeling of reliability structures and industrial processes
Statistical modeling of reliability structures and industrial processes
Author 
Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.
Preferred Shelf Number 
TA169
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003203124
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Cover image for Design of mechanical systems based on statistics : a guide to improving product reliability
Design of mechanical systems based on statistics : a guide to improving product reliability
Author 
Woo, Seong-woo, author.
Preferred Shelf Number 
TJ245.5
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429022050
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
Cover image for Reliability management and engineering : challenges and future trends
Reliability management and engineering : challenges and future trends
Author 
Garg, Harish, editor. Ram, Mangey, editor.
Preferred Shelf Number 
TA169
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429268922
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Cover image for Multi-criteria decision models in software reliability : methods and applications
Multi-criteria decision models in software reliability : methods and applications
Author 
Mishra, Ashish (Ashish Kumar), editor. Dieu Linh, Nguyen Thi, editor. Bhardwaj, Manish (Professor of computer science and engineering), editor. Pinto, Carla M. A. (Computer scientist), editor.
Preferred Shelf Number 
QA76.76 .R44 M85 2023
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780367816414
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
Cover image for What every engineer should know about reliability and risk analysis
What every engineer should know about reliability and risk analysis
Author 
Modarres, M. (Mohammad), author. Groth, Katrina, author.
Preferred Shelf Number 
TA169 .M63 2023
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003307495
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Cover image for Achieving Product Reliability : A Key to Business Success.
Achieving Product Reliability : A Key to Business Success.
Author 
Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.
Preferred Shelf Number 
TS156
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003181361
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
Cover image for Barrier engineering : models and methods for technical safety
Barrier engineering : models and methods for technical safety
Author 
Liu, Yiliu, author.
Preferred Shelf Number 
TA169.7
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003245636
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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9. 
Cover image for Prognostics and Remaining Useful Life (RUL) Estimation : Predicting with Confidence.
Prognostics and Remaining Useful Life (RUL) Estimation : Predicting with Confidence.
Author 
Galar, Diego, author. Goebel, Kai, author. Sandborn, Peter A., 1959- author. Kumar, Uday, author.
Preferred Shelf Number 
TJ174
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003097242
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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