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1. 
Cover image for VLSI test principles and architectures design for testability
VLSI test principles and architectures design for testability
Author 
Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.
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ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
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2. 
Cover image for Assessing Speaking
Assessing Speaking
Author 
Luoma, Sari.
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3. 
Cover image for Digital circuit testing a guide to DFT and other techniques
Digital circuit testing a guide to DFT and other techniques
Author 
Wang, Francis C.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780127345802
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