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1. 
Cover image for Correlation spectroscopy of surfaces, thin films, and nanostructures
Correlation spectroscopy of surfaces, thin films, and nanostructures
Author 
Berakdar, J., 1964- Kirschner, J. (Jürgen), 1945- John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
Volltext http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527603425
John Wiley http://dx.doi.org/10.1002/3527603425
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2. 
Cover image for Nanoscale Materials for Warfare Agent Detection: Nanoscience for Security
Nanoscale Materials for Warfare Agent Detection: Nanoscience for Security
Author 
Bittencourt, Carla. editor. Ewels, Chris. editor. Llobet, Eduard. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-94-024-1620-6
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3. 
Cover image for Thin film analysis by X-ray scattering
Thin film analysis by X-ray scattering
Author 
Birkholz, Mario. Fewster, Paul F. Genzel, Christoph. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/3527607595
http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282
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