Cover image for VLSI test principles and architectures design for testability
Title:
VLSI test principles and architectures design for testability
Author:
Wang, Laung-Terng.
ISBN:
9780080474793
Publication Information:
Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Physical Description:
1 online resource (xxx, 777 p.) : ill.
Series:
The Morgan Kaufmann series in systems on silicon
Series Title:
The Morgan Kaufmann series in systems on silicon
Subject Term:
Integrated circuits -- Very large scale integration -- Testing.

Integrated circuits -- Very large scale integration -- Design.

Testen.

VLSI.
Added Author:
Wang, Laung-Terng.

Wu, Cheng-Wen, EE Ph. D.

Wen, Xiaoqing.
Electronic Access:
ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
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