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1. 
Cover image for Accelerated life testing of one-shot devices : data collection and analysis
Accelerated life testing of one-shot devices : data collection and analysis
Author 
Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.
Preferred Shelf Number 
TA169.3 .B35 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031
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2. 
Cover image for Reliability prediction and testing textbook
Reliability prediction and testing textbook
Author 
Klyatis, Lev M., author. Anderson, Edward, 1945- author.
Preferred Shelf Number 
TA169.3 .K5964 2018
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949
Format: 
Availability 
Online Library~1
Available:
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