Cover image for Semiconductor memories technology, testing, and reliability
Title:
Semiconductor memories technology, testing, and reliability
Author:
Sharma, Ashok K.
ISBN:
9780470546406
Publication Information:
Piscataway, N.J. : IEEE Press ; New York : Institute of Electrical and Electronics Engineers, c1997.
Physical Description:
1 online resource (xii, 462 p.) : ill.
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