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1. 
Cover image for Particle Size Measurements Fundamentals, Practice, Quality
Particle Size Measurements Fundamentals, Practice, Quality
Author 
Merkus, Henk G. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-9016-5
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2. 
Cover image for Vacuum Technology Practice for Scientific Instruments
Vacuum Technology Practice for Scientific Instruments
Author 
Yoshimura, Nagamitsu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-74433-7
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3. 
Cover image for Nanoscale Devices - Fundamentals and Applications
Nanoscale Devices - Fundamentals and Applications
Author 
Gross, Rudolf. editor. Sidorenko, Anatolie. editor. Tagirov, Lenar. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5107-4
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4. 
Cover image for PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
Author 
Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5258-8
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5. 
Cover image for Microscale Diagnostic Techniques
Microscale Diagnostic Techniques
Author 
Breuer, Kenneth S. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137604
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6. 
Cover image for Integrated Chemical Microsensor Systems in CMOS Technology
Integrated Chemical Microsensor Systems in CMOS Technology
Author 
Hierlemann, Andreas. author. Baltes, H. editor. Fujita, Hiroyuki. editor. Liepmann, Dorian. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138987
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