Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition

Title:

Author:

Sachdev, Manoj. editor.

ISBN:

9780387465470

Physical Description:

XXI, 328 p. online resource.

Series:

Frontiers in Electronic Testing, 34

Series Title:

Frontiers in Electronic Testing, 0929-1296 ; 34

Subject Term:

Added Author:

Added Corporate Author:

Electronic Access:

Holds:
Copies:

Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	166351-2001	ONLINE	Searching... Unknown	Searching... Unavailable