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1. 
Cover image for Process Optimization A Statistical Approach
Process Optimization A Statistical Approach
Author 
Castillo, Enrique Del. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71435-6
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2. 
Cover image for Bayesian process monitoring, control and optimization
Bayesian process monitoring, control and optimization
Author 
Colosimo, Bianca M. Del Castillo, Enrique.
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ONLINE
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Distributed by publisher. Purchase or institutional license may be required for access.
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3. 
Cover image for Run-to-run control in semiconductor manufacturing
Run-to-run control in semiconductor manufacturing
Author 
Moyne, James. Del Castillo, Enrique. Hurwitz, Arnon Max.
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ONLINE
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Distributed by publisher. Purchase or institutional license may be required for access.
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