Search Results for Integrated circuits -- Testing.

18 Results Found

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Testing for small-delay defects in nanoscale CMOS integrated circuits

Author

Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.

Preferred Shelf Number

ONLINE(342881.1)

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3D IC stacking technology

Author

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

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ONLINE

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ESD failure mechanisms and models

Author

Voldman, Steven H. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Author

Yichuang Sun, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS019E

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System-on-chip test architectures nanometer design for testability

Author

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

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RF measurements for cellular phones and wireless data systems

Author

Scott, Allan W. Frobenius, Rex.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014

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The VLSI handbook

Author

Chen, Wai-Kai, 1936-

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ONLINE

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Digital integrated circuits : design-for-test using Simulink and Stateflow

Author

Perelroyzen, Evgeni.

Preferred Shelf Number

TK7874 .P445 2007

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VLSI test principles and architectures design for testability

Author

Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123705976

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10.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Author

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Preferred Shelf Number

TK7874.75 B87 2000

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11.

Integrated circuit manufacturability the art of process and design integration

Author

Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097

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12.

VLSI Testing Digital and mixed analogue/digital techniques

Author

Hurst, Stanley L.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS009E

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