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1. 
Cover image for Applied Pattern Recognition
Applied Pattern Recognition
Author 
Bunke, Horst. editor. Kandel, Abraham. editor. Last, Mark. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-76831-9
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Cover image for Similarity-Based Pattern Analysis and Recognition
Similarity-Based Pattern Analysis and Recognition
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Pelillo, Marcello. editor. SpringerLink (Online service)
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ONLINE(331228.1)
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http://dx.doi.org/10.1007/978-1-4471-5628-4
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3. 
Cover image for Computational Intelligence for Pattern Recognition
Computational Intelligence for Pattern Recognition
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Pedrycz, Witold. editor. Chen, Shyi-Ming. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-89629-8
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Cover image for Pattern Recognition and Classification An Introduction
Pattern Recognition and Classification An Introduction
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Dougherty, Geoff. author. SpringerLink (Online service)
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ONLINE(331742.1)
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http://dx.doi.org/10.1007/978-1-4614-5323-9
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5. 
Cover image for Pattern Recognition, Machine Intelligence and Biometrics
Pattern Recognition, Machine Intelligence and Biometrics
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Wang, Patrick S. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-22407-2
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6. 
Cover image for Data Complexity in Pattern Recognition
Data Complexity in Pattern Recognition
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Basu, Mitra. editor. Ho, Tin Kam. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84628-172-3
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7. 
Cover image for Evolutionary Synthesis of Pattern Recognition Systems
Evolutionary Synthesis of Pattern Recognition Systems
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Bhanu, Bir. author. Lin, Yingqiang. author. Krawiec, Krzysztof. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b105515
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8. 
Cover image for Pattern Recognition : Concepts, Methods and Applications
Pattern Recognition : Concepts, Methods and Applications
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Marques de Sá, Joaquim P.
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TA1650 M37 2001
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9. 
Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Author 
Bai, Xiao. editor. Hancock, Edwin R. editor. Ho, Tin Kam. editor. Wilson, Richard C. editor. Biggio, Battista. editor.
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https://doi.org/10.1007/978-3-319-97785-0
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10. 
Cover image for Pattern Recognition and Computer Vision First Chinese Conference, PRCV 2018, Guangzhou, China, November 23-26, 2018, Proceedings, Part II
Pattern Recognition and Computer Vision First Chinese Conference, PRCV 2018, Guangzhou, China, November 23-26, 2018, Proceedings, Part II
Author 
Lai, Jian-Huang. editor. Liu, Cheng-Lin. editor. Chen, Xilin. editor. Zhou, Jie. editor. Tan, Tieniu. editor.
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https://doi.org/10.1007/978-3-030-03335-4
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11. 
Cover image for Pattern Recognition and Computer Vision First Chinese Conference, PRCV 2018, Guangzhou, China, November 23-26, 2018, Proceedings, Part III
Pattern Recognition and Computer Vision First Chinese Conference, PRCV 2018, Guangzhou, China, November 23-26, 2018, Proceedings, Part III
Author 
Lai, Jian-Huang. editor. Liu, Cheng-Lin. editor. Chen, Xilin. editor. Zhou, Jie. editor. Tan, Tieniu. editor.
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https://doi.org/10.1007/978-3-030-03338-5
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12. 
Cover image for Pattern Recognition and Computer Vision First Chinese Conference, PRCV 2018, Guangzhou, China, November 23-26, 2018, Proceedings, Part IV
Pattern Recognition and Computer Vision First Chinese Conference, PRCV 2018, Guangzhou, China, November 23-26, 2018, Proceedings, Part IV
Author 
Lai, Jian-Huang. editor. Liu, Cheng-Lin. editor. Chen, Xilin. editor. Zhou, Jie. editor. Tan, Tieniu. editor.
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https://doi.org/10.1007/978-3-030-03341-5
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