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1. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.
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Wiley Online Library
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2. 
Cover image for Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Author 
Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.
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ONLINE(357151.1)
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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3. 
Cover image for Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Author 
Boutier, A. (Alain)
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Electronic Access 
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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118576847
John Wiley http://dx.doi.org/10.1002/9781118576847
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4. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
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http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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5. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
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ScienceDirect http://www.sciencedirect.com/science/book/9780080964546
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6. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
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ONLINE(355774.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546
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7. 
Cover image for Ultra-fast material metrology
Ultra-fast material metrology
Author 
Horn, Alexander, PD Dr.
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071
John Wiley http://dx.doi.org/10.1002/9783527627929
http://site.ebrary.com/lib/alltitles/Doc?id=10332978
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8. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
Author 
Collège français de métrologie. Wiley InterScience (Online service)
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ONLINE
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Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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