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1. 
Cover image for CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-1349-7
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2. 
Cover image for Cloud Computing with Security and Scalability. Concepts and Practices
Cloud Computing with Security and Scalability. Concepts and Practices
Author 
Sehgal, Naresh Kumar. author. Bhatt, Pramod Chandra P. author. Acken, John M. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-07242-0
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3. 
Cover image for Machine Learning Support for Fault Diagnosis of System-on-Chip
Machine Learning Support for Fault Diagnosis of System-on-Chip
Author 
Girard, Patrick. editor. Blanton, Shawn. editor. Wang, Li-C. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-19639-3
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4. 
Cover image for Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
Author 
Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-99-0055-8
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5. 
Cover image for Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
Author 
Bhuvaneswari, M.C. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-1958-3
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6. 
Cover image for Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Author 
Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-1556-9
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7. 
Cover image for Counterfeit Integrated Circuits Detection and Avoidance
Counterfeit Integrated Circuits Detection and Avoidance
Author 
Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-11824-6
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8. 
Cover image for Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
Author 
Ohnhäuser, Frank. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-662-47020-6
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