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1. 
Cover image for Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9377-9
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2. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-173-3
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3. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-8297-1
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4. 
Cover image for Test Pattern Generation using Boolean Proof Engines
Test Pattern Generation using Boolean Proof Engines
Author 
Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-90-481-2360-5
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5. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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6. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5315-0
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7. 
Cover image for System-Level Validation High-Level Modeling and Directed Test Generation Techniques
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
Author 
Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)
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ONLINE(331265.1)
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http://dx.doi.org/10.1007/978-1-4614-1359-2
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8. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
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http://dx.doi.org/10.1007/978-90-481-9644-9
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9. 
Cover image for Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Author 
Bou-Sleiman, Sleiman. author. Ismail, Mohammed. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-9548-3
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10. 
Cover image for High Quality Test Pattern Generation and Boolean Satisfiability
High Quality Test Pattern Generation and Boolean Satisfiability
Author 
Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-9976-4
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11. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9725-5
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12. 
Cover image for Digital System Test and Testable Design Using HDL Models and Architectures
Digital System Test and Testable Design Using HDL Models and Architectures
Author 
Navabi, Zainalabedin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7548-5
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