Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
7 Results Found Subscribe to search results
0000000DEFAULT
Print
1. 
Cover image for Terrestrial radiation effects in ULSI devices and electronic systems
Terrestrial radiation effects in ULSI devices and electronic systems
Author 
Ibe, Eishi H., author.
Preferred Shelf Number 
ONLINE(342252.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118479308
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Author 
Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(518551.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-19872-9
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Green electronics manufacturing creating environmental sensible products
Green electronics manufacturing creating environmental sensible products
Author 
Wang, John X., 1962-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Low-power HF Microelectronics A unified approach
Low-power HF Microelectronics A unified approach
Author 
Machado, Gerson A. S., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS008E
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Electronics reliability and measurement technology nondestructive evaluation
Electronics reliability and measurement technology nondestructive evaluation
Author 
Heyman, Joseph S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717
Format: 
Availability 
Online Library~1
Available:
Copies: