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1. 
Cover image for Properties of amorphous silicon and its alloys
Properties of amorphous silicon and its alloys
Author 
Searle, Tim. ed. Institution of Electrical Engineers.
Preferred Shelf Number 
TK 7871.15.S55 P73 1998
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2. 
Cover image for Silicon, germanium, and their alloys : growth, defects, impurities, and nanocrystals
Silicon, germanium, and their alloys : growth, defects, impurities, and nanocrystals
Author 
Kissinger, Gudrun, editor. Pizzini, Sergio, editor.
Preferred Shelf Number 
TA480 .G4 S545 2015
Electronic Access 
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3. 
Cover image for Hidrojenlendirilmiş amorf silisyum ve silisyum-karbon anlaşımlarında ışık ile yaratılan yarı-kararlı kusurların incelenmesi = Light induced metastable defect studies in hydrogenated amorphous silicon and silicon-carbon alloys
Hidrojenlendirilmiş amorf silisyum ve silisyum-karbon anlaşımlarında ışık ile yaratılan yarı-kararlı kusurların incelenmesi = Light induced metastable defect studies in hydrogenated amorphous silicon and silicon-carbon alloys
Author 
Kodolbaş, A. Osman.
Preferred Shelf Number 
TEZ 4392 .K63 1999
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4. 
Cover image for Surface Structure Modification and Hardening of Al-Si Alloys
Surface Structure Modification and Hardening of Al-Si Alloys
Author 
Romanov, Denis A., author. Moskovskii, Stanislav. V., author. Gromov, V. E. (Viktor Evgenʹevich), author.
Preferred Shelf Number 
TA480 .A6
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003080589
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Cover image for Thermoelectric energy conversion : basic concepts and device applications
Thermoelectric energy conversion : basic concepts and device applications
Author 
Davila Pineda, Diana, editor. Rezania, Alireza, editor.
Preferred Shelf Number 
TJ163.3
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527698110
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6. 
Cover image for Fracture, Fatigue, Failure, and Damage Evolution, Volume 5 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Fracture, Fatigue, Failure, and Damage Evolution, Volume 5 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Author 
Carroll, Jay. editor. Daly, Samantha. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06977-7
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7. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.
Preferred Shelf Number 
TK7871 .D44 2009
Electronic Access 
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8. 
Cover image for Properties of semiconductor alloys group-IV, III-V and II-VI semiconductors
Properties of semiconductor alloys group-IV, III-V and II-VI semiconductors
Author 
Adachi, Sadao, 1950-
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470744383
MyiLibrary, Table of contents http://www.myilibrary.com?id=212352&ref=toc
http://onlinelibrary.wiley.com/book/10.1002/9780470744383
http://site.ebrary.com/lib/alltitles/Doc?id=10297966
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9. 
Cover image for SiGe and Si strained-layer epitaxy for silicon heterostructure devices
SiGe and Si strained-layer epitaxy for silicon heterostructure devices
Author 
Cressler, John D.
Preferred Shelf Number 
TK7871.96 .B55 S53 2008
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10. 
Cover image for Bionanotechnology : global prospects
Bionanotechnology : global prospects
Author 
Reisner, David Evans. Bronzino, Joseph D., 1937-
Preferred Shelf Number 
TP248.25 .N35 B565 2008
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11. 
Cover image for Advanced structural materials : properties, design optimization, and applications
Advanced structural materials : properties, design optimization, and applications
Author 
Soboyejo, W. O. Srivatsan, T. S.
Preferred Shelf Number 
TA459 .A38 2007
Electronic Access 
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12. 
Cover image for Technology Computer Aided Design for Si, SiGe and GaAs Integrated Circuits
Technology Computer Aided Design for Si, SiGe and GaAs Integrated Circuits
Author 
Maiti, C. K. Armstrong, G. A.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS021E
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