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13. 
Cover image for Applications and Theory of Petri Nets 29th International Conference, PETRI NETS 2008, Xi’an, China, June 23-27, 2008. Proceedings
Applications and Theory of Petri Nets 29th International Conference, PETRI NETS 2008, Xi’an, China, June 23-27, 2008. Proceedings
Author 
Hee, Kees M. editor. Valk, Rüdiger. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-68746-7
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14. 
Cover image for Principles of the Spin Model Checker
Principles of the Spin Model Checker
Author 
Ben-Ari, Mordechai. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84628-770-1
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15. 
Cover image for Do-All Computing in Distributed Systems Cooperation in the Presence of Adversity
Do-All Computing in Distributed Systems Cooperation in the Presence of Adversity
Author 
Georgiou, Chryssis. author. Shvartsman, Alexander A. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-69045-2
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16. 
Cover image for Petri Nets and Other Models of Concurrency – ICATPN 2007 28th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, ICATPN 2007, Siedlce, Poland, June 25-29, 2007. Proceedings
Petri Nets and Other Models of Concurrency – ICATPN 2007 28th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, ICATPN 2007, Siedlce, Poland, June 25-29, 2007. Proceedings
Author 
Kleijn, Jetty. editor. Yakovlev, Alex. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-73094-1
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17. 
Cover image for Embedded signal processing with the Micro Signal Architecture
Embedded signal processing with the Micro Signal Architecture
Author 
Gan, Woon-Seng. Kuo, Sen M. (Sen-Maw)
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237473
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18. 
Cover image for Elements of quantum information
Elements of quantum information
Author 
Schleich, Wolfgang. Walther, H. (Herbert), 1935-2006. Wiley InterScience (Online service)
Preferred Shelf Number 
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Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527611065
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19. 
Cover image for Petri Nets and Other Models of Concurrency - ICATPN 2006 27th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, Turku, Finland, June 26-30, 2006. Proceedings
Petri Nets and Other Models of Concurrency - ICATPN 2006 27th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, Turku, Finland, June 26-30, 2006. Proceedings
Author 
Donatelli, Susanna. editor. Thiagarajan, P. S. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/11767589
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20. 
Cover image for Model-based signal processing
Model-based signal processing
Author 
Candy, J. V.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238083
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21. 
Cover image for Lectures on quantum information
Lectures on quantum information
Author 
Bruss, Dagmar. Leuchs, Gerd. Wiley InterScience (Online service)
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Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527618637
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22. 
Cover image for Applications and Theory of Petri Nets 2005 26th International Conference, ICATPN 2005, Miami, USA, June 20-25, 2005. Proceedings
Applications and Theory of Petri Nets 2005 26th International Conference, ICATPN 2005, Miami, USA, June 20-25, 2005. Proceedings
Author 
Ciardo, Gianfranco. editor. Darondeau, Philippe. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b136988
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23. 
Cover image for Quantum computation and quantum information
Quantum computation and quantum information
Author 
Nielsen, Michael A. 1974- Chuang, Isaac L., 1968-
Preferred Shelf Number 
QA76.889 N54 2005
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24. 
Cover image for Testing for EMC compliance approaches and techniques
Testing for EMC compliance approaches and techniques
Author 
Montrose, Mark I. Nakauchi, Edward M.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008
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