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13. 
Cover image for Reliability Engineering Theory and Practice
Reliability Engineering Theory and Practice
Author 
Birolini, Alessandro. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-49390-7
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14. 
Cover image for Software engineering : design, reliability and management
Software engineering : design, reliability and management
Author 
Shooman, Martin L.
Preferred Shelf Number 
QA 76.9.S88 S56 1983
Format: 
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15. 
Cover image for Durability and reliability in engineering desing
Durability and reliability in engineering desing
Author 
Kivenson, Gilbert.
Preferred Shelf Number 
TS 173 K57 1971
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16. 
Cover image for Telecommunications system reliability engineering, theory, and practice
Telecommunications system reliability engineering, theory, and practice
Author 
Ayers, Mark L.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044
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17. 
Cover image for Hydrosystems engineering reliability assessment and risk analysis
Hydrosystems engineering reliability assessment and risk analysis
Author 
Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
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18. 
Cover image for Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
Author 
De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-62319-1
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19. 
Cover image for Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
Author 
Ali, Syed Riffat. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-01647-0
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20. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-93683-3
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21. 
Cover image for Fundamentals of reliability engineering : applications in multistage interconnection networks
Fundamentals of reliability engineering : applications in multistage interconnection networks
Author 
Gunawan, Indra.
Preferred Shelf Number 
ONLINE(342010.1)
Electronic Access 
Books24x7 http://www.books24x7.com/marc.asp?bookid=63558
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079
Ebook Library http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0
ebrary http://site.ebrary.com/id/10843879
John Wiley http://dx.doi.org/10.1002/9781118914410
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22. 
Cover image for Gas and oil reliability engineering modeling and analysis
Gas and oil reliability engineering modeling and analysis
Author 
Calixto, Eduardo.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123919144
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23. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332682.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00122-7
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24. 
Cover image for Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Author 
Epperlein, Peter W.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506
John Wiley http://dx.doi.org/10.1002/9781118481882
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