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13. 
Cover image for Engineering materials 2 : an introduction to microstructures, processing and design
Engineering materials 2 : an introduction to microstructures, processing and design
Author 
Ashby, Michael F. Jones, David R. H., ort. yaz.
Preferred Shelf Number 
TA 403 .A84 2006
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14. 
Cover image for Sustainable energy systems engineering : the complete green building design resource
Sustainable energy systems engineering : the complete green building design resource
Author 
Gevorkian, Peter.
Preferred Shelf Number 
TJ808 .G48 2007
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15. 
Cover image for Systems engineering with SysML/UML modeling, analysis, design
Systems engineering with SysML/UML modeling, analysis, design
Author 
Weilkiens, Tim.
Preferred Shelf Number 
ONLINE(313039.1)
Electronic Access 
Knovel http://app.knovel.com/hotlink/toc/id:kpSESMLUM6/systems-engineering-with
Knovel http://app.knovel.com/web/toc.v/cid:kpSESMLUM6
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16. 
Cover image for Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Author 
Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-32989-7
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17. 
Cover image for Design of Systems on a Chip: Design and Test
Design of Systems on a Chip: Design and Test
Author 
Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-32500-X
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18. 
Cover image for Applied Computational Materials Modeling Theory, Simulation and Experiment
Applied Computational Materials Modeling Theory, Simulation and Experiment
Author 
Bozzolo, Guillermo. editor. Noebe, Ronadl D. editor. Abel, Phillip B. editor. Vij, D.R. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-34565-9
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19. 
Cover image for Residual Stress Measurement and the Slitting Method
Residual Stress Measurement and the Slitting Method
Author 
Cheng, Weili. author. Finnie, Iain. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-39030-7
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20. 
Cover image for Inverse Problems in Electric Circuits and Electromagnetics
Inverse Problems in Electric Circuits and Electromagnetics
Author 
Chechurin, V. L. author. Korovkin, N. V. author. Hayakawa, M. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-46047-5
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21. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/0-387-46547-2
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22. 
Cover image for Stability and Optimization of Structures Generalized Sensitivity Analysis
Stability and Optimization of Structures Generalized Sensitivity Analysis
Author 
Ohsaki, Makoto. editor. Ikeda, Kiyohiro. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-68184-9
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23. 
Cover image for Integrated Circuit Packaging, Assembly and Interconnections
Integrated Circuit Packaging, Assembly and Interconnections
Author 
Greig, William J. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-33913-2
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24. 
Cover image for Constructal Theory of Social Dynamics
Constructal Theory of Social Dynamics
Author 
Bejan, Adrian. author. Merkx, Gilbert W. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-47681-0
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