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13. 
Cover image for Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings
Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings
Author 
Krishnamurthy, Arvind. editor. Plattner, Bernhard. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-642-12334-4
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14. 
Cover image for Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 15th International GI/ITG Conference, MMB&DFT 2010, Essen, Germany, March 15-17, 2010. Proceedings
Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 15th International GI/ITG Conference, MMB&DFT 2010, Essen, Germany, March 15-17, 2010. Proceedings
Author 
Müller-Clostermann, Bruno. editor. Echtle, Klaus. editor. Rathgeb, Erwin P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-12104-3
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15. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Author 
Abran, Alain. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Cuadrado-Gallego, Juan J. editor. Brunekreef, Jacob. editor.
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http://dx.doi.org/10.1007/978-3-642-05415-0
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16. 
Cover image for The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement
The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement
Author 
Bundschuh, Manfred. author. Dekkers, Carol. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-68188-5
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17. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Author 
Dumke, Reiner R. editor. Braungarten, René. editor. Büren, Günter. editor. Abran, Alain. editor. Cuadrado-Gallego, Juan J. editor.
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http://dx.doi.org/10.1007/978-3-540-89403-2
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18. 
Cover image for Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Author 
Cuadrado-Gallego, Juan J. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Abran, Alain. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-85553-8
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19. 
Cover image for Best Practices in Software Measurement How to use metrics to improve project and process performance
Best Practices in Software Measurement How to use metrics to improve project and process performance
Author 
Ebert, Christof. author. Bundschuh, Manfred. author. Dumke, Reiner. author. Schmietendorf, Andreas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138013
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20. 
Cover image for Autonomous Sensor Networks Collective Sensing Strategies for Analytical Purposes
Autonomous Sensor Networks Collective Sensing Strategies for Analytical Purposes
Author 
Filippini, Daniel. editor. SpringerLink (Online service)
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ONLINE(333878.1)
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http://dx.doi.org/10.1007/978-3-642-34648-4
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21. 
Cover image for Software engineering for image processing systems
Software engineering for image processing systems
Author 
Laplante, Phillip A.
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Distributed by publisher. Purchase or institutional license may be required for access.
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