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Subject: Electronic books.

Author

Wiley InterScience (Online service)

(9)

(4)

(2)

Schneidewind, Norman.

(2)

Alouini, Mohamed-Slim.

(1)

Augustin, Thomas, editor.

(1)

(1)

Bergman, Bo, 1943-

(1)

Bernstein, Lawrence, 1940-

(1)

Blischke, W. R., 1934-

(1)

Carlson, Carl (Carl Seymour)

(1)

Castet, Jean-François.

(1)

Chan, H. Anthony, 1952-

(1)

Chowdhury, Ali A.

(1)

Connally, Eric.

(1)

Curtis, Peter M.

(1)

Curtis, Peter M., author.

(1)

Dodson, Bryan, 1962- author.

(1)

Englert, Paul J, 1960-

(1)

(1)

Fuller, Edwin R.

(1)

Gullo, Louis J.

(1)

Hammett, Patrick C., author.

(1)

(1)

Huang, J. C., 1935-

(1)

IEEE Solid-State Circuits Council.

(1)

International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.)

(1)

Jackson, Scott.

(1)

Kanoun, Karama.

(1)

Kartalopoulos, Stamatios V.

(1)

(1)

Kimber, Douglas A.

(1)

Klerx, Rene, author.

(1)

Klyatis, Lev M.

(1)

Koval, D. O. (Don Orest)

(1)

Kuo, Way, 1951-

(1)

Lemaire, Maurice.

(1)

Li, Wenyuan, 1946- author.

(1)

(1)

McCool, John, 1936-

(1)

Mobley, R. Keith, 1943-

(1)

Murthy, D. N. P.

(1)

Natvig, Bent, 1946-

(1)

Ohji, T. (Tatsuki)

(1)

Pascoe, Norman.

(1)

Pukite, Jan, 1928-

(1)

(1)

(1)

Saleh, Joseph H., 1971-

(1)

Salem, J. A. (Jonathan A.), 1960-

(1)

Sharma, Ashok K.

(1)

Simon, Marvin Kenneth, 1939-

(1)

Smith, David John, 1943-

(1)

(1)

Spainhower, Lisa.

(1)

Strong, Alvin Wayne, 1946-

(1)

Suhir, Ephraim.

(1)

Temple, L. Parker.

(1)

Ushakov, I. A. (Igorʹ Alekseevich)

(1)

Voldman, Steven H.

(1)

Walker, N. Edward.

(1)

Wereszczak, Andrew.

(1)

Yu, T. X. (Tongxi), 1941-

(1)

(1)

(1)

(1)

Language

(23)

Publication Date

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(10)

(9)

(4)

(4)

(3)

(3)

(3)

(2)

(2)

(1)

(1)

(1)

Subject

Reliability (Engineering)

(15)

Computer software -- Reliability.

(5)

Electronic apparatus and appliances -- Reliability.

(3)

Software engineering.

(3)

COMPUTERS -- Software Development & Engineering -- General.

(2)

Electric power systems -- Reliability -- Mathematical models.

(2)

Engineering design.

(2)

Metal oxide semiconductors, Complementary -- Reliability.

(2)

Monte Carlo method.

(2)

(2)

Reliability (Engineering) -- Mathematical models.

(2)

Systems engineering.

(2)

TECHNOLOGY & ENGINEERING -- Electrical.

(2)

TECHNOLOGY & ENGINEERING / Quality Control

(2)

Accelerated life testing.

(1)

Benchmarking (Management)

(1)

CMOS-Schaltung.

(1)

COMPUTERS -- Data Transmission Systems -- General.

(1)

COMPUTERS -- Networking -- Vendor Specific.

(1)

COMPUTERS -- Software Development & Engineering -- Systems Analysis & Design.

(1)

COMPUTERS / Logic Design

(1)

Ceramic materials -- Corrosion -- Congresses.

(1)

Cloud computing.

(1)

Communication Technology.

(1)

Computer engineering.

(1)

Computer input-output equipment -- Reliability.

(1)

Computer networks -- Reliability.

(1)

Computer security.

(1)

Computer software -- Quality control.

(1)

Computer software -- Testing.

(1)

Computer systems -- Reliability.

(1)

Debugging in computer science.

(1)

Digital communications -- Reliability -- Mathematics.

(1)

Electric discharges.

(1)

Electric power failures -- Risk assessment.

(1)

Electric power systems -- Reliability.

(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronic circuit design.

(1)

Electronic digital computers -- Reliability.

(1)

Electronics -- United States -- History -- 20th century.

(1)

Electronics in military engineering -- United States -- History -- 20th century.

(1)

Electrostatics.

(1)

Environmental testing.

(1)

Failure mode and effects analysis.

(1)

Fault location (Engineering)

(1)

Fault tolerance (Engineering)

(1)

Fault-tolerant computing.

(1)

Fiabilité -- Modèles mathématiques.

(1)

(1)

Industrial design -- Statistical methods.

(1)

Industrial design.

(1)

Industrial priorities.

(1)

Industrial safety.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing.

(1)

Maintainability (Engineering)

(1)

Manufacturing processes -- Quality control.

(1)

Metal oxide semiconductors, Complementary -- Defects.

(1)

Microstructure.

(1)

Optical communications.

(1)

Optoelectronic devices -- Reliability.

(1)

Ordinateurs -- Fiabilité.

(1)

Probabilities -- Textbooks.

(1)

Quality control.

(1)

Quality of products.

(1)

Radio -- Transmitters and transmission -- Fading.

(1)

Redundancy (Engineering)

(1)

(1)

Risk assessment.

(1)

Robust statistics.

(1)

Schaltungsentwurf.

(1)

Semiconductor storage devices.

(1)

Semiconductors -- Failures.

(1)

Signal processing -- Digital techniques.

(1)

Six sigma (Quality control standard)

(1)

Space vehicles -- Reliability.

(1)

Stochastic systems.

(1)

Structural dynamics.

(1)

Structural engineering -- Mathematics.

(1)

Structural failures.

(1)

System failures (Engineering)

(1)

System failures (Engineering) -- Prevention.

(1)

(1)

Systems availability.

(1)

Systems engineering -- Management.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Digital.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

(1)

TECHNOLOGY & ENGINEERING -- Quality Control.

(1)

TECHNOLOGY & ENGINEERING -- Telecommunications.

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI

(1)

TECHNOLOGY & ENGINEERING / Electronics / General.

(1)

TECHNOLOGY & ENGINEERING / Quality Control.

(1)

TECHNOLOGY & ENGINEERING / Telecommunications

(1)

Telecommunication systems.

(1)

Tolérance aux fautes (informatique)

(1)

Wavelength division multiplexing.

(1)

Weibull distribution -- Textbooks.

(1)

Material Type

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Electronic Library

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13.

Cover image for Reliability technology principles and practice of failure prevention in electronic systems

Reliability technology principles and practice of failure prevention in electronic systems

Reliability technology principles and practice of failure prevention in electronic systems

Author

Pascoe, Norman.

Preferred Shelf Number

ONLINE

Electronic Access

Available by subscription from Safari Books Online
John Wiley http://dx.doi.org/10.1002/9780470980101
http://onlinelibrary.wiley.com/book/10.1002/9780470980101
Books24x7 http://www.books24x7.com/marc.asp?bookid=41740

Format:

Availability

Online Library~1

Available:
Copies:

14.

Cover image for Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems

Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems

Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems

Author

Bauer, Eric. Adams, Randee. Eustace, Dan.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598

Format:

Availability

Online Library~1

Available:
Copies:

15.

Cover image for Using the Weibull distribution reliability, modeling, and inference

Using the Weibull distribution reliability, modeling, and inference

Using the Weibull distribution reliability, modeling, and inference

Author

McCool, John, 1936-

Preferred Shelf Number

ONLINE

Electronic Access

Connect to MyiLibrary resource.
Wiley InterScience http://dx.doi.org/10.1002/9781118351994
Books24x7 http://www.books24x7.com/marc.asp?bookid=51285
ebrary http://site.ebrary.com/id/10593122
http://swb.eblib.com/patron/FullRecord.aspx?p=894399

Format:

Availability

Online Library~1

Available:
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16.

Cover image for Importance measures in reliability, risk, and optimization principles and applications

Importance measures in reliability, risk, and optimization principles and applications

Importance measures in reliability, risk, and optimization principles and applications

Author

Kuo, Way, 1951- Zhu, Xiaoyan.

Preferred Shelf Number

ONLINE

Electronic Access

Available by subscription from Safari Books Online
Cover image http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160
John Wiley http://dx.doi.org/10.1002/9781118314593
http://site.ebrary.com/lib/alltitles/Doc?id=10559415

Format:

Availability

Online Library~1

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17.

Cover image for Spacecraft reliability and multi-state failures a statistical approach

Spacecraft reliability and multi-state failures a statistical approach

Spacecraft reliability and multi-state failures a statistical approach

Author

Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Click here to view book
Books24x7 http://www.books24x7.com/marc.asp?bookid=41710
http://site.ebrary.com/lib/alltitles/Doc?id=10510309

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Online Library~1

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18.

Cover image for Design for reliability information and computer-based systems

Design for reliability information and computer-based systems

Design for reliability information and computer-based systems

Author

Bauer, Eric.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779

Format:

Availability

Online Library~1

Available:
Copies:

19.

Cover image for Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida

Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida

Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida

Author

International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470456347
http://site.ebrary.com/lib/alltitles/Doc?id=10297839

Format:

Availability

Online Library~1

Available:
Copies:

20.

Cover image for Power distribution system reliability practical methods and applications

Power distribution system reliability practical methods and applications

Power distribution system reliability practical methods and applications

Author

Chowdhury, Ali A. Koval, D. O. (Don Orest)

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031

Format:

Availability

Online Library~1

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21.

Cover image for Robust design methodology for reliability exploring the effects of variation and uncertainty

Robust design methodology for reliability exploring the effects of variation and uncertainty

Robust design methodology for reliability exploring the effects of variation and uncertainty

Author

Bergman, Bo, 1943- Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321
John Wiley http://dx.doi.org/10.1002/9780470748794
Cover image http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg
http://site.ebrary.com/lib/alltitles/Doc?id=10331496

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22.

Cover image for Tutorial on hardware and software reliability, maintainability, and availability

Tutorial on hardware and software reliability, maintainability, and availability

Tutorial on hardware and software reliability, maintainability, and availability

Author

Schneidewind, Norman.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540

Format:

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Online Library~1

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23.

Cover image for Reliability, maintainability and risk practical methods for engineers

Reliability, maintainability and risk practical methods for engineers

Reliability, maintainability and risk practical methods for engineers

Author

Smith, David John, 1943-

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750666947

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Availability

Online Library~1

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24.

Cover image for Fault detectability in DWDM toward higher signal quality & system reliability

Fault detectability in DWDM toward higher signal quality & system reliability

Fault detectability in DWDM toward higher signal quality & system reliability

Author

Kartalopoulos, Stamatios V.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624

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