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13. 
Cover image for Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
Author 
Kalinin, Sergei. Gruverman, Alexei.
Preferred Shelf Number 
QH212. S33 2007 V.2
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14. 
Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-28668-6
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15. 
Cover image for Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-37316-2
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16. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b139097
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17. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-37231-8
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18. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3019-3
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19. 
Cover image for Scanning probe microscopy : the lab on a tip
Scanning probe microscopy : the lab on a tip
Author 
Meyer, Ernst, 1962- Hug, Hans J. (Hans Josef), 1964- ort.yaz. Bennewitz, Roland, 1967- ort.yaz.
Preferred Shelf Number 
QH 212.S33 M49 2004
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20. 
Cover image for Hybridizing surface probe microscopies towards a full description of the meso- and nanoworlds
Hybridizing surface probe microscopies towards a full description of the meso- and nanoworlds
Author 
Moreno-Flores, Susan. Toca-Herrera, Jos ̌L. (Jos ̌Luis), 1967-
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21. 
Cover image for Single-atom nanoelectronics
Single-atom nanoelectronics
Author 
Prati, Enrico. Shinada, Takahiro.
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22. 
Cover image for Physical chemistry chemical kinetics and reaction mechanisms
Physical chemistry chemical kinetics and reaction mechanisms
Author 
Trimm, Harold H. (Harold Henry), 1955-
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23. 
Cover image for Instrumental community probe microscopy and the path to nanotechnology
Instrumental community probe microscopy and the path to nanotechnology
Author 
Mody, Cyrus C. M. (Cyrus Cawas Maneck), 1974- Project Muse.
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24. 
Cover image for Handbook of surface and interface analysis methods for problem-solving
Handbook of surface and interface analysis methods for problem-solving
Author 
Rivir̈e, J. C. Myhra, S. (Sverre), 1943-
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