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Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Author 
Yeung, Dit-Yan. editor. Kwok, James T. editor. Fred, Ana. editor. Roli, Fabio. editor. Ridder, Dick. editor.
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http://dx.doi.org/10.1007/11815921
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