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Publication Date: 2005

Author

SpringerLink (Online service)

(5)

John Wiley & Sons.

(3)

(2)

(2)

Alouini, Mohamed-Slim.

(1)

Balakrishnan, N. editor.

(1)

Bernstein, Lawrence, 1940-

(1)

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)

(1)

Dahll, Gustav. editor.

(1)

(1)

Dhillon, B. S. (Balbir S.), 1947-

(1)

El-Haik, Basem.

(1)

Gheorghe, Adrian V. editor.

(1)

Ghiocel, Dan M.

(1)

Gran, Bjørn Axel. editor.

(1)

Hattangadi, A. A.

(1)

Huzurbazar, Aparna V., 1966-

(1)

Kannan, N. editor.

(1)

Levitin, Gregory. author.

(1)

(1)

Licari, James J., 1930-

(1)

Nagaraja, H. N. editor.

(1)

Nakagawa, Toshio. author.

(1)

Nikolaidis, Efstratios.

(1)

(1)

Simon, Marvin Kenneth, 1939-

(1)

Singhal, Suren.

(1)

Smith, David John, 1943-

(1)

Swanson, Dale W.

(1)

Tsokos, Chris P.

(1)

United States. Air Force. Office of Scientific Research.

(1)

University of South Florida.

(1)

Wiley InterScience (Online service)

(1)

Winther, Rune. editor.

(1)

(1)

Şencan, Hüner.

(1)

Language

(18)

Subject

Reliability (Engineering)

(5)

Electronic books.

(4)

Engineering design.

(4)

(3)

(3)

Communications software.

(2)

Computer software -- Development.

(2)

Embedded computer systems.

(2)

Güvenilirlik (Mühendislik)

(2)

Industrial safety.

(2)

Reliability (Engineering) -- Mathematical models.

(2)

Risk assessment -- Mathematical models.

(2)

Software engineering.

(2)

Telecommunication systems.

(2)

(1)

Bayesian statistical decision theory -- Congresses.

(1)

Bilgisayar yazılımı -- Gelişim.

(1)

(1)

Communication Technology.

(1)

Computer aided design.

(1)

Computer science.

(1)

Computer software -- Reliability.

(1)

Digital communications -- Reliability -- Mathematics.

(1)

Distribution (Probability theory).

(1)

Economics -- Statistics.

(1)

Electric power systems -- Reliability -- Mathematical models.

(1)

Electronic packaging.

(1)

Electronics -- Materials.

(1)

Embedded bilgisayar sistemleri.

(1)

Endüstriyel güvenlik.

(1)

Engineering design -- Handbooks, manuals, etc.

(1)

Engineering economy.

(1)

Environmental sciences.

(1)

(1)

Güvenilirlik (Mühendislik) -- Matematiksel modeller.

(1)

Industrial engineering.

(1)

Information Systems.

(1)

Information systems.

(1)

(1)

Maintainability (Engineering)

(1)

Mathematical statistics.

(1)

Monte Carlo method.

(1)

Mühendislik tasarımı.

(1)

Process control.

(1)

Production management.

(1)

Quality control.

(1)

Radio -- Transmitters and transmission -- Fading.

(1)

Reliability (Engineering) -- Handbooks, manuals, etc.

(1)

Reliability (Engineering) -- Mathematical models -- Congresses.

(1)

Reliability (Engineering) -- Statistical methods.

(1)

Risk yönetimi -- Matematiksel modeller.

(1)

Six sigma (Quality control standard)

(1)

Social sciences -- Methodology.

(1)

Social sciences -- Statistical methods.

(1)

Social sciences.

(1)

Sosyal Bilimler -- Yöntembilim.

(1)

Sosyal Bilimler -- İstatistiksel Yöntemler.

(1)

(1)

Stochastic processes.

(1)

TECHNOLOGY & ENGINEERING -- Telecommunications.

(1)

Telekomünikasyon sistemleri.

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Library

Beytepe Library

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13.

Cover image for Robust communications software extreme availability, reliability and scalability for carrier-grade systems

Robust communications software extreme availability, reliability and scalability for carrier-grade systems

Robust communications software extreme availability, reliability and scalability for carrier-grade systems

Author

Utas, Greg. John Wiley & Sons.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/0470011793

Format:

Availability

Online Library~1

Available:
Copies:

14.

Cover image for Reliability, maintainability and risk practical methods for engineers

Reliability, maintainability and risk practical methods for engineers

Reliability, maintainability and risk practical methods for engineers

Author

Smith, David John, 1943-

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750666947

Format:

Availability

Online Library~1

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Copies:

15.

Cover image for Adhesives technology for electronic applications materials, processes, reliability

Adhesives technology for electronic applications materials, processes, reliability

Adhesives technology for electronic applications materials, processes, reliability

Author

Licari, James J., 1930- Swanson, Dale W.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780815515135

Format:

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Online Library~1

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16.

Cover image for Integrated Risk and Vulnerability Management Assisted by Decision Support Systems Relevance and Impact on Governance

Integrated Risk and Vulnerability Management Assisted by Decision Support Systems Relevance and Impact on Governance

Integrated Risk and Vulnerability Management Assisted by Decision Support Systems Relevance and Impact on Governance

Author

Gheorghe, Adrian V. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/1-4020-3721-X

Format:

Availability

Online Library~1

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17.

Cover image for Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilik

Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilik

Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilik

Author

Şencan, Hüner.

Preferred Shelf Number

BF176 .S463 2005

Format:

Availability

Beytepe Library~1

Available:
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18.

Cover image for Digital communication over fading channels

Digital communication over fading channels

Digital communication over fading channels

Author

Simon, Marvin Kenneth, 1939- Alouini, Mohamed-Slim.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261

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Online Library~1

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19.

Cover image for Risk assessment of power systems models, methods, and applications

Risk assessment of power systems models, methods, and applications

Risk assessment of power systems models, methods, and applications

Author

Li, Wenyuan.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312

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Availability

Online Library~1

Available:
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20.

Cover image for Trustworthy systems through quantitative software engineering

Trustworthy systems through quantitative software engineering

Trustworthy systems through quantitative software engineering

Author

Bernstein, Lawrence, 1940- Yuhas, C. M. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898

Format:

Availability

Online Library~1

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21.

Cover image for Flowgraph models for multistate time-to-event data

Flowgraph models for multistate time-to-event data

Flowgraph models for multistate time-to-event data

Author

Huzurbazar, Aparna V., 1966- John Wiley & Sons.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/0471686565

Format:

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Online Library~1

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22.

Cover image for Plant and machinery failure prevention

Plant and machinery failure prevention

Plant and machinery failure prevention

Author

Hattangadi, A. A.

Preferred Shelf Number

ONLINE

Electronic Access

Subscription required

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