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13. 
Cover image for Stochastic Processes with Applications to Reliability Theory
Stochastic Processes with Applications to Reliability Theory
Author 
Nakagawa, Toshio. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-274-2
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14. 
Cover image for Reliability of Microtechnology Interconnects, Devices and Systems
Reliability of Microtechnology Interconnects, Devices and Systems
Author 
Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.
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http://dx.doi.org/10.1007/978-1-4419-5760-3
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15. 
Cover image for Reliability centered maintenance (RCM) implementation made simple
Reliability centered maintenance (RCM) implementation made simple
Author 
Bloom, Neil.
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16. 
Cover image for Hydrosystems engineering reliability assessment and risk analysis
Hydrosystems engineering reliability assessment and risk analysis
Author 
Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.
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17. 
Cover image for Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Author 
Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-310-7
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18. 
Cover image for Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
Author 
Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-694-8
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19. 
Cover image for Reliability technology principles and practice of failure prevention in electronic systems
Reliability technology principles and practice of failure prevention in electronic systems
Author 
Pascoe, Norman.
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Available by subscription from Safari Books Online
John Wiley http://dx.doi.org/10.1002/9780470980101
http://onlinelibrary.wiley.com/book/10.1002/9780470980101
Books24x7 http://www.books24x7.com/marc.asp?bookid=41740
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20. 
Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
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Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.
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ScienceDirect http://www.sciencedirect.com/science/book/9780127021010
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21. 
Cover image for Assessment of Power System Reliability Methods and Applications
Assessment of Power System Reliability Methods and Applications
Author 
Čepin, Marko. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-688-7
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22. 
Cover image for Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Author 
Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6217-1
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23. 
Cover image for Reliability Engineering Basic Concepts and Applications in ICT
Reliability Engineering Basic Concepts and Applications in ICT
Author 
Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.
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http://dx.doi.org/10.1007/978-3-642-20983-3
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24. 
Cover image for Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings
Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings
Author 
Tjoa, A Min. editor. Quirchmayr, Gerald. editor. You, Ilsun. editor. Xu, Lida. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-23300-5
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