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13. 
Cover image for Software performance and scalability a quantitative approach
Software performance and scalability a quantitative approach
Author 
Liu, Henry H. Wiley InterScience (Online service)
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Books24x7 http://www.books24x7.com/marc.asp?bookid=33731
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=448916
John Wiley http://dx.doi.org/10.1002/9780470465394
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9780470462539
MyiLibrary, Table of contents http://www.myilibrary.com?id=223744&ref=toc
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14. 
Cover image for Trustworthy compilers
Trustworthy compilers
Author 
Safonov, V. O. (Vladimir Olegovich)
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ONLINE
Electronic Access 
Books24x7 http://www.books24x7.com/marc.asp?bookid=35179
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=485634
John Wiley http://dx.doi.org/10.1002/9780470593387
http://site.ebrary.com/lib/alltitles/Doc?id=10366446
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15. 
Cover image for Software measurement and estimation a practical approach
Software measurement and estimation a practical approach
Author 
Laird, Linda M., 1952- Brennan, M. Carol, 1954- IEEE Computer Society. John Wiley & Sons.
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896
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16. 
Cover image for Unit testing in Java how tests drive the code
Unit testing in Java how tests drive the code
Author 
Link, Johannes. Frlich, Peter.
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Volltext http://www.sciencedirect.com/science/book/9781558608689
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17. 
Cover image for Rapid prototyping of software for avionics systems : model-oriented approaches for complex systems certification
Rapid prototyping of software for avionics systems : model-oriented approaches for complex systems certification
Author 
Larrieu, Nicolas, author. Varet, Antoine, author.
Preferred Shelf Number 
ONLINE(342171.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781119050643
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18. 
Cover image for Software architecture. 1
Software architecture. 1
Author 
Oussalah, Mourad, editor of compilation.
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ONLINE(342044.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118930960
Books24x7 http://www.books24x7.com/marc.asp?bookid=63727
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19. 
Cover image for Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
Author 
Bauer, Eric. Adams, Randee. Eustace, Dan.
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598
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20. 
Cover image for Solving enterprise applications performance puzzles queuing models to the rescue
Solving enterprise applications performance puzzles queuing models to the rescue
Author 
Grinshpan, L. A. (Leonid Abramovich) Wiley InterScience (Online service)
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IEEEXplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168885
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21. 
Cover image for Semantic web and model-driven engineering
Semantic web and model-driven engineering
Author 
Parreiras, Fernando Silva. Wiley InterScience (Online service)
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6218883
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22. 
Cover image for Making sense of agile project management balancing control and agility
Making sense of agile project management balancing control and agility
Author 
Cobb, Charles G., 1945-
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Books24x7 http://www.books24x7.com/marc.asp?bookid=40741
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9781118085950
Cover image http://catalogimages.wiley.com/images/db/jimages/9780470943366.jpg
http://site.ebrary.com/lib/alltitles/Doc?id=10447802
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23. 
Cover image for Practical database programming with Java
Practical database programming with Java
Author 
Bai, Ying, 1956-
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988888
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24. 
Cover image for Software metrics and software metrology
Software metrics and software metrology
Author 
Abran, Alain, 1949-
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Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791
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