Limit Search Results
Author
SpringerLink (Online service)
(28)
Drechsler, Rolf. author.
(2)
Bhushan, Manjul. author.
(1)
Boiko, Igor. author.
(1)
Bosio, Alberto. author.
(1)
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
28 Results Found Subscribe to search results
000000000000DEFAULT
Print
13. 
Cover image for High Quality Test Pattern Generation and Boolean Satisfiability
High Quality Test Pattern Generation and Boolean Satisfiability
Author 
Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9976-4
Format: 
Availability 
Online Library~1
Available:
Copies:
14. 
Cover image for Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methods
Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methods
Author 
Liu, Tao. author. Gao, Furong. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-977-2
Format: 
Availability 
Online Library~1
Available:
Copies:
15. 
Cover image for Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Author 
Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9398-1
Format: 
Availability 
Online Library~1
Available:
Copies:
16. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9725-5
Format: 
Availability 
Online Library~1
Available:
Copies:
17. 
Cover image for Efficient Test Methodologies for High-Speed Serial Links
Efficient Test Methodologies for High-Speed Serial Links
Author 
Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3443-4
Format: 
Availability 
Online Library~1
Available:
Copies:
18. 
Cover image for RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
Author 
Liu, Ai-Qun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-46262-2
Format: 
Availability 
Online Library~1
Available:
Copies:
19. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author 
Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0938-1
Format: 
Availability 
Online Library~1
Available:
Copies:
20. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
Format: 
Availability 
Online Library~1
Available:
Copies:
21. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8363-1
Format: 
Availability 
Online Library~1
Available:
Copies:
22. 
Cover image for Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Author 
Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6488-3
Format: 
Availability 
Online Library~1
Available:
Copies:
23. 
Cover image for Design of Systems on a Chip: Design and Test
Design of Systems on a Chip: Design and Test
Author 
Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-32500-X
Format: 
Availability 
Online Library~1
Available:
Copies:
24. 
Cover image for Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
Author 
Weinmann, Alexander. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-211-37139-8
Format: 
Availability 
Online Library~1
Available:
Copies: