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13. 
Cover image for Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop
Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop
Author 
Fardis, Michael N. editor. Rakicevic, Zoran T. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-1977-4
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14. 
Cover image for The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
Author 
Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-236-0
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15. 
Cover image for Split Hopkinson (Kolsky) Bar Design, Testing and Applications
Split Hopkinson (Kolsky) Bar Design, Testing and Applications
Author 
Chen, Weinong. author. Song, Bo. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7982-7
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16. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
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17. 
Cover image for Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables
Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables
Author 
Farahmand, Bahram. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-95924-5
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18. 
Cover image for Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
Author 
Grosse, Christian. editor. Ohtsu, Masayasu. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-540-69972-9
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19. 
Cover image for Modern Testing Techniques for Structural Systems Dynamics and Control
Modern Testing Techniques for Structural Systems Dynamics and Control
Author 
Bursi, Oreste S. editor. Wagg, David. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-211-09445-7
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20. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6993-4
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21. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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22. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8363-1
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23. 
Cover image for New Methods of Concurrent Checking
New Methods of Concurrent Checking
Author 
Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8420-1
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24. 
Cover image for Gizopoulos / Advances in ElectronicTesting
Gizopoulos / Advances in ElectronicTesting
Author 
Gizopoulos, Dimitris. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-29409-0
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