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Trallero-Giner, C. Pérez-Alvarez, R. García-Moliner, F.
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Basu, P. K. (Prasanta Kumar)
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Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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Shank, C. V. (Charles V.) Zakharcheni͡a, Boris Petrovich.
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Elliott, R. J. (Roger J.), 1928- Ipatova, I. P. (Ija P.), 1929-
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Haug, Hartmut.
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Meier, F. (Felix), 1943- Zakharcheni͡a, Boris Petrovich.
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