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13. 
Cover image for Handbook of software fault localization : foundations and advances
Handbook of software fault localization : foundations and advances
Author 
Wong, W. Eric, editor. Tse, T. H., editor. John Wiley & Sons, publisher.
Preferred Shelf Number 
QA76.76 .F34 H36 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119880929
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14. 
Cover image for Fundamentals and methods of machine and deep learning : algorithms, tools and applications
Fundamentals and methods of machine and deep learning : algorithms, tools and applications
Author 
Singh, Pradeep, editor.
Preferred Shelf Number 
Q325.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119821908
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15. 
Cover image for Statistics at square one
Statistics at square one
Author 
Campbell, Michael J., 1950- editor.
Preferred Shelf Number 
RA407 .S73 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119402350
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16. 
Cover image for Design for excellence in electronics manufacturing
Design for excellence in electronics manufacturing
Author 
Tulkoff, Cheryl, author. Caswell, Greg, author.
Preferred Shelf Number 
TK7870 .T845 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119109402
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17. 
Cover image for Applied univariate, bivariate, and multivariate statistics using Python
Applied univariate, bivariate, and multivariate statistics using Python
Author 
Denis, Daniel J., 1974- author.
Preferred Shelf Number 
QA276.45 .P98 D46 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119578208
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18. 
Cover image for Univariate, bivariate, and multivariate statistics using R : quantitative tools for data analysis and data science
Univariate, bivariate, and multivariate statistics using R : quantitative tools for data analysis and data science
Author 
Denis, Daniel J., 1974- author.
Preferred Shelf Number 
QA279 .D45776 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119549963
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19. 
Cover image for Applied statistics : theory and problem solutions with R
Applied statistics : theory and problem solutions with R
Author 
Rasch, Dieter, author. Verdooren, L. R., author. Pilz, Jürgen, 1951- author.
Preferred Shelf Number 
QA276 .R37 A67 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551584
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20. 
Cover image for Structural equation modeling with lavaan
Structural equation modeling with lavaan
Author 
Gana, Kamel, author. Broc, Guillaume, author.
Preferred Shelf Number 
QA278.3
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119579038
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21. 
Cover image for Statistics in environmental sciences
Statistics in environmental sciences
Author 
David, Valerie.
Preferred Shelf Number 
GE45 .S73
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119649724
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22. 
Cover image for Risk assessment : tools, techniques, and their applications
Risk assessment : tools, techniques, and their applications
Author 
Ostrom, Lee T., author. Wilhelmsen, Cheryl A., 1953- author.
Preferred Shelf Number 
TA169.55 .R57 O88 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119483342
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23. 
Cover image for Robust statistics : theory and methods (with R)
Robust statistics : theory and methods (with R)
Author 
Maronna, Ricardo A., author. Martin, R. Douglas, author. Yohai, Víctor J., author.
Preferred Shelf Number 
QA276 .M336 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656
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24. 
Cover image for Kernel smoothing : principles, methods and applications
Kernel smoothing : principles, methods and applications
Author 
Ghosh, S. (Sucharita), author.
Preferred Shelf Number 
QA278
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781118890370
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