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1. 
Cover image for LSI/VLSI testability design
LSI/VLSI testability design
Author 
Tsui, Frank F.
Preferred Shelf Number 
TH 7874 T78 1987
Format: 
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Beytepe Library~1
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2. 
Cover image for Silicides for VLSI applications
Silicides for VLSI applications
Author 
Murarka, S. P.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780125112208
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3. 
Cover image for Graphene and VLSI Interconnects
Graphene and VLSI Interconnects
Author 
Tan, Cher Ming, 1959- author. Narula, Udit. Sangwan, Vivek.
Preferred Shelf Number 
TK7874.75
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003224884
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
Cover image for Analog and VLSI circuits
Analog and VLSI circuits
Author 
Chen, Wai-Kai, 1936-
Preferred Shelf Number 
TK7874.654 .A47 2009
Electronic Access 
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5. 
Cover image for High-speed VLSI interconnections
High-speed VLSI interconnections
Author 
Goel, Ashok K., 1953-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516
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6. 
Cover image for VLSI circuits and embedded systems
VLSI circuits and embedded systems
Author 
Babu, Hafiz Md. Hasan, 1966- author.
Preferred Shelf Number 
TK7874.75
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003269182
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Cover image for Advanced VLSI design and testability issues
Advanced VLSI design and testability issues
Author 
Tripathi, Suman Lata. Saxena, Sobhit. Mohapatra, Sushanta Kumar.
Preferred Shelf Number 
TK7874.75
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003083436
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
Cover image for Learning from VLSI Design Experience
Learning from VLSI Design Experience
Author 
Lee, Weng Fook. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-03238-8
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9. 
Cover image for Contactless VLSI Measurement and Testing Techniques
Contactless VLSI Measurement and Testing Techniques
Author 
Sayil, Selahattin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-69673-7
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10. 
Cover image for Low-Power VLSI Circuits and Systems
Low-Power VLSI Circuits and Systems
Author 
Pal, Ajit. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-1937-8
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11. 
Cover image for Multi-Net Optimization of VLSI Interconnect
Multi-Net Optimization of VLSI Interconnect
Author 
Moiseev, Konstantin. author. Kolodny, Avinoam. author. Wimer, Shmuel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-0821-5
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12. 
Cover image for VLSI : circuits for emerging applications
VLSI : circuits for emerging applications
Author 
Wojcicki, Tomasz, editor.
Preferred Shelf Number 
TK7874.75 .V57155 2014
Electronic Access 
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