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25. 
Cover image for Verification and validation for quality of UML 2.0 models
Verification and validation for quality of UML 2.0 models
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Unhelkar, Bhuvan. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/0471734322
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26. 
Cover image for Distributed data management for grid computing
Distributed data management for grid computing
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Di Stefano, Michael, 1963- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471738220
MyiLibrary, Table of contents http://www.myilibrary.com?id=27752&ref=toc
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27. 
Cover image for Error correction coding mathematical methods and algorithms
Error correction coding mathematical methods and algorithms
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Moon, Todd K.
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John Wiley http://dx.doi.org/10.1002/0471739219
John Wiley http://dx.doi.org/10.1002/9780471739210
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28. 
Cover image for Quantum approach to informatics
Quantum approach to informatics
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Stenholm, Stig. Suominen, Kalle-Antti, 1964- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471739367
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29. 
Cover image for Probability, statistics, and stochastic processes
Probability, statistics, and stochastic processes
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Olofsson, Peter, 1963-
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John Wiley http://dx.doi.org/10.1002/9780471743064
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30. 
Cover image for OFDM-based broadband wireless networks design and optimization
OFDM-based broadband wireless networks design and optimization
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Liu, Hui, 1968- Li, Guoqing, 1974- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471757195
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31. 
Cover image for Fourier analysis
Fourier analysis
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Stade, Eric, 1961-
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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32. 
Cover image for Constrained statistical inference inequality, order, and shape restrictions
Constrained statistical inference inequality, order, and shape restrictions
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Silvapulle, Mervyn J., 1951- Sen, Pranab Kumar, 1937- Wiley InterScience (Online service)
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33. 
Cover image for Essentials of business process outsourcing
Essentials of business process outsourcing
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Duening, Thomas N. Click, Rick L.
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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34. 
Cover image for Characterization and modeling to control sintered ceramic microstructures and properties proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004)
Characterization and modeling to control sintered ceramic microstructures and properties proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004)
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DiAntonio, C. B. American Ceramic Society. Meeting (106th : 2004 : Indianapolis, Ind.) Wiley InterScience (Online service) Characterization and Modeling to Control Sintered Ceramic Microstructure and Properties Symposium (2004 : Indianapolis, Ind.)
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35. 
Cover image for Ceramic nanomaterials and nanotechnology III proceedings of the 106th Annual Meeting of The American Ceramic Society : Indianapolis, indiana, USA (2004)
Ceramic nanomaterials and nanotechnology III proceedings of the 106th Annual Meeting of The American Ceramic Society : Indianapolis, indiana, USA (2004)
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Lu, Song Wei. Hu, Michael Z.-C. Gogot͡si, I͡U. G., 1961- Wiley InterScience (Online service) Nanostructured Materials and Nanotechnology Symposium (2004 : Indianapolis, Ind.)
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36. 
Cover image for Innovative processing and synthesis of ceramics, glasses, and composites VIII proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004)
Innovative processing and synthesis of ceramics, glasses, and composites VIII proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004)
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Bansal, Narottam P. Singh, Jitendra Prasad, 1946- Schneider, Hartmut. American Ceramic Society. Meeting (106th : 2004 : Indianapolis, Ind.) Wiley InterScience (Online service)
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